Microscopic bulk damage in dielectric materials using nanojoule femtosecond laser pulses Academic Article uri icon

Overview

abstract

  • The thresholds for bulk damage and critical self-focusing in fused silica were studied using 110-fs pulses at both 400-nm and 800-nm wavelength. It was found that permanent damage can be produced with energies of only tens of nanojoules. In addition, no significant self-focusing at these energies is observed.

publication date

  • January 1999

Research

keywords

  • Academic Article

Additional Document Info

start page

  • 232